16

Hot carrier induced device degradation in RF-nMOSFET's

Année:
1998
Langue:
english
Fichier:
PDF, 260 KB
english, 1998
44

Optical Turbulence Model Sensitized to the Microscale Reynolds Number

Année:
2013
Langue:
english
Fichier:
PDF, 322 KB
english, 2013